Bonding
Our expertise comprises both conventional and proprietary bonding methods:
- Anodic bonding
- Silicon fusion bonding
- Wire bonding
- Die bonding
Anodic BondingThis process generates very tightly connected layers, produced by the application of high voltage and high temperature, and is ideal for the irreversible covering of microfluidic channels. - Bonding of double and triple sandwiches of silicon and Pyrex glass
- Maximal substrate diameter: 4 inches (10 cm)
- Process temperature between 300°C and 450°C.
- Bonding with or without prealignment. Aligning accuracy ≥ 5 microns.
- Bonding of insulator (Silicon oxide SiO2 or silicon nitride Si3N4) silicon surfaces.
| | Die Bonding Using Adhesives - Computer Aided Design and sieve production for screen printing of adhesives
- CAD and preparation of polymer spacers
- Adhesive die bonding on whole wafers or on single chips
- Aligning accuracy ≥ 5 microns
- Usage of conductive adhesive to interconnect electrodes of top and bottom substrate of the die bonded sandwich
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Silicon-glass sandwich
| | Glass-silicon-glass sandwich (Patent 01993578.2-1524)
| | 35 µm thick polymer layer on top of a glass wafer with SiO2- insulated platinum electrodes | | Glass-polymer-glass flow through cell, assembled by die bonding using photo- lithographically patterned polymer spacer and screen printed adhesive Patent PCT/DE 01/03324) |
Silicon Fusion Bonding
- Adhesive bonding after wet chemical pretreatment of substrates in strong acids
- For double sandwiches of (micro-machined) silicon
- Maximal substrate diameter: 4 inches (10 cm)
- Process temperature between 950°C and 1100°C under nitrogen atmosphere
Wire Bonding
- On or between glass, silicon, ceramic, printed circuit boards with metal bond pads.
- Wire material AlSi1, diameter: 25 microns.
- Minimal bond pad area 30 x 30 microns².
- Sealing of bond wires with epoxy.